Electrical Characterization of GaN:Si and AlGaN:Si

Examensarbete för masterexamen

Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.12380/154356
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Type: Examensarbete för masterexamen
Master Thesis
Title: Electrical Characterization of GaN:Si and AlGaN:Si
Authors: Ye, Hong
Keywords: Materialvetenskap;Nanovetenskap och nanoteknik;Elektroteknik och elektronik;Materials Science;Nanoscience & Nanotechnology;Electrical Engineering, Electronic Engineering, Information Engineering
Issue Date: 2011
Publisher: Chalmers tekniska högskola / Institutionen för mikroteknologi och nanovetenskap
Chalmers University of Technology / Department of Microtechnology and Nanoscience
URI: https://hdl.handle.net/20.500.12380/154356
Collection:Examensarbeten för masterexamen // Master Theses



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