Characterizations of GaAs-based long wavelenght laser materials by X-ray diffraction

Examensarbete för masterexamen

Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.12380/2922
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Type: Examensarbete för masterexamen
Master Thesis
Title: Characterizations of GaAs-based long wavelenght laser materials by X-ray diffraction
Authors: Gu, Qin Fen
Keywords: Fysik;Physical Sciences
Issue Date: 2005
Publisher: Chalmers tekniska högskola / Institutionen för mikroteknologi och nanovetenskap
Chalmers University of Technology / Department of Microtechnology and Nanoscience
URI: https://hdl.handle.net/20.500.12380/2922
Collection:Examensarbeten för masterexamen // Master Theses



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