Determining the concentraton of Mn in (Ga,Mn)As by means of X-ray Photoelectron Spectroscopy

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dc.contributor.authorOrhe, Aruviere
dc.contributor.departmentChalmers tekniska högskola / Institutionen för teknisk fysiksv
dc.contributor.departmentChalmers University of Technology / Department of Applied Physicsen
dc.date.accessioned2019-07-03T13:34:39Z
dc.date.available2019-07-03T13:34:39Z
dc.date.issued2014
dc.description.abstractThis thesis work investigates the ability of x-ray photoelectron spectroscopy (XPS) to assess the Mn concentration in the Ga1-xMnxAs. For this purpose measurements were the performed on samples with different nominal Mn concentrations in the range 0.5-5%. The samples were sputtered with argon ions to remove surface oxide and carbon contamination, and to record the depth distribution of Mn. The results show that the method can be used for the estimation of the Mn concentration provided that the (XPS) sensitivity factors used are accurate, a correct background is used and that the spectra are recorded with good statistics.
dc.identifier.urihttps://hdl.handle.net/20.500.12380/205894
dc.language.isoeng
dc.setspec.uppsokPhysicsChemistryMaths
dc.subjectFysik
dc.subjectDen kondenserade materiens fysik
dc.subjectHalvledarfysik
dc.subjectMaterialvetenskap
dc.subjectPhysical Sciences
dc.subjectCondensed Matter Physics
dc.subjectSemiconductor physics
dc.subjectMaterials Science
dc.titleDetermining the concentraton of Mn in (Ga,Mn)As by means of X-ray Photoelectron Spectroscopy
dc.type.degreeExamensarbete för masterexamensv
dc.type.degreeMaster Thesisen
dc.type.uppsokH
local.programmeApplied physics (MPAPP), MSc
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