Determining the concentration of manganese in (Ga, Mn) As by means of X-ray Photoelectron Spectroscopy

dc.contributor.author	Orhe, Aruviere
dc.contributor.department	Chalmers tekniska högskola / Institutionen för teknisk fysik	sv
dc.contributor.department	Chalmers University of Technology / Department of Applied Physics	en
dc.date.accessioned	2019-07-03T13:36:21Z
dc.date.available	2019-07-03T13:36:21Z
dc.date.issued	2015
dc.description.abstract	ABSTRACT This thesis work investigates the ability of x-ray photoelectron spectroscopy(XPS) to assess the Mn concentration in the Ga1-xMnxAs. For this purpose measurements were the performed on samples with different nominal Mn concentrations in the range 0.5-5%. The samples were sputtered with argon ions to remove surface oxide and carbon contamination, and to record the depth distribution of Mn. The results show that the method can be used for the estimation of the Mn concentration provided that the (XPS) sensitivity factors used are accurate, a correct background is used and that the spectra are recorded with good statistics.
dc.identifier.uri	https://hdl.handle.net/20.500.12380/213160
dc.language.iso	eng
dc.setspec.uppsok	PhysicsChemistryMaths
dc.subject	Fysik
dc.subject	Annan fysik
dc.subject	Physical Sciences
dc.subject	Other Physics Topics
dc.title	Determining the concentration of manganese in (Ga, Mn) As by means of X-ray Photoelectron Spectroscopy
dc.type.degree	Examensarbete för masterexamen	sv
dc.type.degree	Master Thesis	en
dc.type.uppsok	H
local.programme	Applied physics (MPAPP), MSc

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