Characterizations of GaAs-based long wavelenght laser materials by X-ray diffraction

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dc.contributor.authorGu, Qin Fen
dc.contributor.departmentChalmers tekniska högskola / Institutionen för mikroteknologi och nanovetenskapsv
dc.contributor.departmentChalmers University of Technology / Department of Microtechnology and Nanoscienceen
dc.date.accessioned2019-07-03T14:14:06Z
dc.date.available2019-07-03T14:14:06Z
dc.date.issued2005
dc.identifier.urihttps://hdl.handle.net/20.500.12380/2922
dc.language.isoeng
dc.setspec.uppsokPhysicsChemistryMaths
dc.subjectFysik
dc.subjectPhysical Sciences
dc.titleCharacterizations of GaAs-based long wavelenght laser materials by X-ray diffraction
dc.type.degreeExamensarbete för masterexamensv
dc.type.degreeMaster Thesisen
dc.type.uppsokH
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