High Frequency Properties of the Oxide materials at millikelvin temperatures for HTS devices in the quantum limit
dc.contributor.author | Vrik, Mudassar Mumtaz | |
dc.contributor.department | Chalmers tekniska högskola / Institutionen för mikroteknologi och nanovetenskap (MC2) | sv |
dc.contributor.examiner | Lombardi, Floriana | |
dc.contributor.supervisor | Bauch, Thilo | |
dc.contributor.supervisor | Lombardi, Floriana | |
dc.date.accessioned | 2021-02-02T09:09:06Z | |
dc.date.available | 2021-02-02T09:09:06Z | |
dc.date.issued | 2021 | sv |
dc.date.submitted | 2020 | |
dc.identifier.coursecode | MCCX03 | sv |
dc.identifier.uri | https://hdl.handle.net/20.500.12380/302183 | |
dc.language.iso | eng | sv |
dc.setspec.uppsok | PhysicsChemistryMaths | |
dc.title | High Frequency Properties of the Oxide materials at millikelvin temperatures for HTS devices in the quantum limit | sv |
dc.type.degree | Examensarbete för masterexamen | sv |
dc.type.uppsok | H |