Determining the concentraton of Mn in (Ga,Mn)As by means of X-ray Photoelectron Spectroscopy

Examensarbete för masterexamen

Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.12380/205894
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Type: Examensarbete för masterexamen
Master Thesis
Title: Determining the concentraton of Mn in (Ga,Mn)As by means of X-ray Photoelectron Spectroscopy
Authors: Orhe, Aruviere
Abstract: This thesis work investigates the ability of x-ray photoelectron spectroscopy (XPS) to assess the Mn concentration in the Ga1-xMnxAs. For this purpose measurements were the performed on samples with different nominal Mn concentrations in the range 0.5-5%. The samples were sputtered with argon ions to remove surface oxide and carbon contamination, and to record the depth distribution of Mn. The results show that the method can be used for the estimation of the Mn concentration provided that the (XPS) sensitivity factors used are accurate, a correct background is used and that the spectra are recorded with good statistics.
Keywords: Fysik;Den kondenserade materiens fysik;Halvledarfysik;Materialvetenskap;Physical Sciences;Condensed Matter Physics;Semiconductor physics;Materials Science
Issue Date: 2014
Publisher: Chalmers tekniska högskola / Institutionen för teknisk fysik
Chalmers University of Technology / Department of Applied Physics
URI: https://hdl.handle.net/20.500.12380/205894
Collection:Examensarbeten för masterexamen // Master Theses



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