Quality inspection using machine learning techniques for pose estimation
| dc.contributor.author | Franson, Filip | |
| dc.contributor.author | Wedenmark, Max | |
| dc.contributor.department | Chalmers tekniska högskola / Institutionen för elektroteknik | sv |
| dc.contributor.examiner | Sattler, Torsten | |
| dc.date.accessioned | 2020-07-03T13:53:00Z | |
| dc.date.available | 2020-07-03T13:53:00Z | |
| dc.date.issued | 2020 | sv |
| dc.date.submitted | 2020 | |
| dc.identifier.coursecode | EENX30 | sv |
| dc.identifier.uri | https://hdl.handle.net/20.500.12380/301301 | |
| dc.language.iso | eng | sv |
| dc.setspec.uppsok | Technology | |
| dc.title | Quality inspection using machine learning techniques for pose estimation | sv |
| dc.type.degree | Examensarbete för masterexamen | sv |
| dc.type.uppsok | H | |
| local.programme | Systems, control and mechatronics (MPSYS), MSc |