Correlating microscopy and ToF-SIMS images to cellulose size using deep learning

dc.contributor.authorFERNANDEZ, BRUNO
dc.contributor.departmentChalmers tekniska högskola / Institutionen för data och informationstekniksv
dc.contributor.departmentChalmers University of Technology / Department of Computer Science and Engineeringen
dc.contributor.examinerEngkvist, Ola
dc.contributor.supervisorJohansson, Simon
dc.date.accessioned2022-11-03T09:37:36Z
dc.date.available2022-11-03T09:37:36Z
dc.date.issued2022
dc.date.submitted2020
dc.description.abstractIn pharmaceutical formulations, chemically modified celluloses are used in several applications and it is often critical to have good quality control for these materials. In this thesis, spot testing after chromatographic separation has been evaluated as a method for material structure analysis. A highly non-linear correlation between material quality and spot appearance was expected and therefore supervised deep learning was used to model this relationship. Optical microscopy images were subjected to a pretrained resnet-18 image model to identify differences in chemical properties between spots. After suitable preprocessing, models could successfully be built to tell the difference between spots from early and late mass fractions. The cellulose fractions were also analyzed as parts of spots by ToF-SIMS. A 3D CNN model was trained from scratch. The model could successfully distinguish between fractions in this case as well.
dc.identifier.coursecodeDATX05
dc.identifier.urihttps://odr.chalmers.se/handle/20.500.12380/305790
dc.language.isoeng
dc.setspec.uppsokTechnology
dc.subjectimaging
dc.subjectconvolutional neural network
dc.subjectexplainability
dc.subjectethyl-cellulose
dc.subjecthydroxypropyl-cellulose
dc.subjecthydroxypropylmethyl-cellulose
dc.subjecttime of flight secondary ion mass-spectroscopy
dc.subjecttof-sims
dc.subjectdeep learning
dc.subjecttransfer learning
dc.titleCorrelating microscopy and ToF-SIMS images to cellulose size using deep learning
dc.type.degreeExamensarbete för masterexamensv
dc.type.degreeMaster's Thesisen
dc.type.uppsokH
local.programmeComputer systems and networks (MPCSN), MSc

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