Error Correction in NAND Flash Memories Using Low-Density Parity-Check Codes

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dc.contributor.authorLundell, Adrian
dc.contributor.authorBlomgren, Carl Fredrik
dc.contributor.departmentChalmers tekniska högskola / Institutionen för elektrotekniksv
dc.contributor.examinerAmat, Alexandre Graell I
dc.contributor.supervisorAmat, Alexandre Graell I
dc.date.accessioned2022-09-27T14:39:25Z
dc.date.available2022-09-27T14:39:25Z
dc.date.issued2022sv
dc.date.submitted2020
dc.description.abstractAn investigation of how low-density parity-check codes can be constructed to efficiently correct errors due to noise mechanims in NAND flash memories.sv
dc.identifier.coursecodeEENX30sv
dc.identifier.urihttps://hdl.handle.net/20.500.12380/305661
dc.language.isoengsv
dc.setspec.uppsokTechnology
dc.titleError Correction in NAND Flash Memories Using Low-Density Parity-Check Codessv
dc.type.degreeExamensarbete för masterexamensv
dc.type.uppsokH
local.programmeComplex adaptive systems (MPCAS), MSc

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